<title>Temporal Evolution of Resistance in He-Irradiated YBa2Cu3O7 Thin Films</title>
</titles>
<publisher>MDPI</publisher>
<publicationYear>2024</publicationYear>
<descriptions>
<descriptiondescriptionType="Other">Evolution of the resistance vs. temperature characteristics of a YBa2Cu3O7 thin film after imprinting a square pinning array of 200 nm spacings by focused helium irradiation. The black line represents the measurement of the sample before irradiation.
Extended data set of Figure 7 in the publication by S. Keppert, B. Aichner, P. Rohringer, M.-A. Aurel Bodea, B. Müller, M. Karrer, R. Kleiner, E. Goldobin, D. Koelle, J. D. Pedarnig, W. Lang: Temporal Evolution of Defects and Related Electric Properties in He-Irradiated YBa2Cu3O7−δ Thin Films, Int. J. Mol. Sci., 25, 7877 (2024), https://doi.org/10.3390/ijms25147877.
Acknowledgment: The research was funded in whole, or in part, by the Austrian Science Fund (FWF) grant DOI: 10.55776/I4865.</description>